The tilted-window cover minimizes optical reflections and interference during in-situ measurements.
Learn MoreSuppresses Fabry–Pérot etalon effects and prevents ghost reflections during high-precision optical measurements.
Learn MoreThe Dome-shaped PEEK cover enables in-situ XRD under controlled environments.
Learn MoreAn optional fiber jig cover allows optical fiber installation on the cover, enabling light delivery and optical measurement.
Learn MoreDirectly injects gas onto the sample stage for controlled environmental conditions.
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