Dome-Type PEEK Cover for In-Situ XRD Experiments
With the optional dome-shaped PEEK cover (0.7 mm thick),
the micro probe system enables in-situ
X-ray diffraction (XRD) under precisely controlled environments.
The transparent PEEK dome ensures vacuum compatibility while allowing real-time measurements
without
removing the sample from the chamber.
This configuration offers an ideal solution for
high-temperature, reactive-gas, or electrical
probing experiments, providing both reliable performance and high X-ray transmittance.
Dimension
(Unit: mm)| Top | 3D |
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| Front | Right |
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