Tilted Window Cover for Optical Characterization
The tilted-window cover option is designed to minimize unwanted optical reflections and interference
during in-situ optical measurements such as laser scanning, reflection, or projection analyses.
By introducing a precisely angled window on the chamber cover, the direct reflection of incident beams
is redirected away from the optical detection path, significantly improving signal clarity and
measurement accuracy.
The tilt angle can be customized according to experimental requirements, allowing optimal optical
alignment for various laser geometries and detection setups.
This configuration is particularly effective for laser-based optical experiments (e.g., MEMS mirror
characterization, optical scanning, or imaging), where flat windows often cause back-reflection noise or
beam overlap.
The tilted window also maintains vacuum compatibility and supports fused silica or sapphire windows,
enabling experiments under controlled temperature, pressure, or gas environments without compromising
performance.
Overall, the tilted-window cover provides a practical and flexible solution for high-precision optical
and environmental characterization, ensuring clean beam transmission and stable in-situ observation
conditions.
Dimension
(Unit: mm)| Top | 3D |
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| Front | Right |
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